On February 16, 2017, the International Workshop on Reliability for Advanced Technology was conducted at the National Taiwan University Convention Center. This forum is a one-day, morning session inviting internationally renowned scholars related to reliability, including Professor Rachid Yazami from Nanyang Technological University of Singapore, Professor Michael G. Pecht from the University of Maryland, and Dr. ChihHsun Chu, Technical Director of NIKON Technology, to give speeches. In the afternoon, research papers and ideas were published by domestic scholars related to reliability technology in China. In the afternoon seminar, the topics for discussion were divided into power battery device / system, mechanical system reliability mechanical devices / systems, quality assurance / control; quality engineering and electronic devices / systems.